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The modular TLA7000 logic analyzer series provides the speed and flexibility you need to capture logic detail on today’s fastest designs. Pinpoint the source of elusive errors and gain the visibility you want with large easy-to-read displays, fast data throughput, and time-correlated views of analog and digital signals through the same probe.

Notice to EU customers

This product is not updated to comply with the RoHS 2 Directive 2011/65/EU and will not be shipped to the EU. Customers may be able to purchase products from inventory that were placed on the EU market prior to July 22, 2017 until supplies are depleted. Tektronix is committed to helping you with your solution needs. Please contact your local sales representative for further assistance or to determine if alternative product(s) are available. Tektronix will continue service to the end of worldwide support life.

Key performance

• MagniVu™ acquisition technology provides up to 20 ps (50 GHz) timing resolution to find and measure elusive timing problems quickly
• Up to 156 ps (6.4 GHz)/512 Mb Record length timing analysis
• Up to 1.4 GHz Clock with up to 3.0 Gb/s Data with a Data Valid window of 180 ps for state acquisition analysis of high-performance synchronous buses
• D-Max® probing system with 0.5 pF capacitive loading eliminates need for on-board connectors, minimizes intrusion on circuits, and is Ideal for differential signal applications
• PCI Express Gen1 through Gen3 including Gen3 Protocol to physical layer analysis for link widths from x1 through x16 with up to 8.0 GT/s acquisition rates and up to 16 GB deep memory (for x16 link)

Key features

• 68/102/136 channel logic analyzers with up to 512 Mb record length
• Glitch and Setup/Hold triggering and display finds and displays elusive hardware problems
• Transitional storage extends the signal analysis capture time for signals that transition infrequently
• Simultaneous state, high-speed timing, and analog analysis through the same probe pinpoints elusive faults
• Trace problems from symptom back to root cause in real time across multiple modules by viewing time-correlated data in a wide variety of display formats
• Comprehensive PCI Express probing solutions, including midbus, slot interposer, and solder-down connectors
• Modular mainframes provide flexibility and expandability
• Broad processor and bus support

Applications

• MIPI protocol analysis
• DDR2 and DDR3 debug and verification
• Signal integrity
• PCI Express debug from Protocol layer to Physical layer
  • Silicon validation
  • Computer system validation
  • Embedded system debug and validation
• Processor/Bus debug and verification
• Embedded software integration, debug, and verification

Breakthrough solutions for real-time digital systems analysis

Tektronix provides breakthrough digital systems analysis tools that enable digital hardware and software designers to capture and analyze the source of elusive problems that threaten product development schedules. The TLA7000 Series provides the speed you need to capture the source of those elusive problems, plus the visibility you want with large displays and fast system data throughput, while protecting your investment with compatibility with all TLA modules.

TLA7012 and TLA7016 mainframes

The TLA7012 Portable and TLA7016 Benchtop mainframes are modular mainframes that accept TLA logic analyzer and pattern generator modules. The TLA7012 and TLA7016 can be configured as either master or expansion mainframes to provide solutions for large numbers of buses and high channel-count requirements.

The TLA7012 Portable Mainframe offers a familiar work environment for the TLA application software. It provides multiple display capability for extended desktop viewing, in addition to an internal DVD-RW, hard drive, and multiple USB ports for expansion. A replaceable hard drive is standard, ideal for security or enabling individual team members to store personal setups and data. Trigger in/out connections provide an interface to other external instrumentation, such as Tektronix oscilloscopes, for correlating measurement results.