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Attrezzatura Nome Inventario n. Note/Info
HP 4142B Power Supply HP 4142B Modular DC Source/Monitor    
4142B Modular DC Source/Monitor

Sheet: HP-4142B

Manuale Completo: download

 

Description

The HP 4142B modular DC source/monitor is a system-use DC measurement instrument especially designed for high-throughput DC semiconductor testers. A completely user-definable system component, the HP 4142B features modular architecture that allows you to build a custom configuration to suit your needs.
Eight plug-in module slots can accommodate any combination of modules. Choose from 2 types of source/monitor unit to force or measure up to +/-200V and +/-1A or a high voltage source/monitor unit sourcing up to 1000V; a voltage source voltage monitor unit, or a analog feedback unit.

Product specifications of HP 4142B (From Used-Line T&M Specifications)

The HP 4142B provides eight slots for a variety of plug-in measurement units. Reduce startup costs by customizing the HP 4142B for your application. As your needs increase, simply add more units. As you move from benchtop to production, easily migrate your tests by adding a compatible wafer prober, switching matrix, capacitance meter, and system software.

For general purpose DC or pulsed measurements, use the HP 4142B Source Monitor Units (SMU). The equivalent of four instruments, these precision modules force voltage while measuring currents down to 2OfA. Or force current and simultaneously monitor voltages down to 4O microV. The HP 41421B SMU conserves space (1 slot) by limiting ranges to +/- 1OOV and +/- 1OOmA. The HP 41420A (2 slots) extends the range to +/- 200V and +/- 1A.

  • Wide measurement range: (+/- 20A, +/-2000V)
  • Excellent sensitivity: (20fA, 4microV)
  • Lightning fast speed (12 msec Vth or hfe measurement)
  • Highly accurate (5-digit, 0.05% V, and 0.2% I)
  • Many measurement modes (pulsed or DC, analog search, lineaer, log, and dual channel sweeps)
  • Built-in synchronization between plug-in modules
  • Interactive measurement and analysis software, including characterization and modeling programs, and automatic test generators