AT – db – 0021

Attrezzatura Nome Inventario n. Note/Info
HP 4263 LCR Meter HP 4263   Manuale
4263B LCR Meter, 100 Hz to 100 kHz

Link: https:/keysight.com

HP / Agilent 4263B
LCR Meter, Refurbished
  • 0.1% basic accuracy
  • 100 Hz, 120 Hz, 1 kHz, 10 kHz, 100 kHz test frequencies
  • 20 m to 1 Vrms in 5m Vrms steps
  • Test signal level monitor function
  • High-speed measurement: 25 ms
  • High-speed contact check
  • Wide capacitance test range
  • Transformer parameter measurements (optional)

HP 4263B LCR meter is Hewlett-Packard’s most cost-effective low-end LCR meter, designed for both component evaluation on the production line and fundamental impedance testing for bench-top applications.  The 4263B has five test frequencies that allow you to simulate testing under the correct conditions: 100 Hz, 120 Hz, 1 kHz, 10 kHz, and 100 kHz.  An optional 20 kHz test frequency can be added to those five frequencies Option 002).

High-Speed Measurements

The 4263B can boost throughput with a measurement speed of 25 ms at any test frequency.  This ability improves the throughput of electrolytic capacitor and transformer testing.  The 4263B can check the contact condition between the test terminals and the device-under-test (DUT).  This function ensures the reliability of PASS/FAIL testing with automatic handlers in production.  The quick recovery system of the 4263B improves throughput.  Normal operation is resumed the instant a faulty DUT is removed from the handler, so the handler can always be operated at its full speed.

Electrolytic Capacitor Measurements

The 4263B’s accuracy and wide measurement range are the right tools to make precise measurements of electrolytic capacitors.  Charged capacitors can discharge through the front end and destroy an instrument.  The 4263B’s front end is designed for protection and maintains test integrity.

Transformer Parameter Measurements

With the 4263B’s ability to make turns ratio (N), mutual inductance (M), and dc resistance (DCR) measurements, data calculations and changing test setups are no longer time-consuming tasks (Option 001).  The flexible signal level setting and the voltage-and-current monitor function facilitate the use of the H4263B for level dependent DUTs, such as core inductors.