{"id":8295,"date":"2021-09-06T07:56:41","date_gmt":"2021-09-06T05:56:41","guid":{"rendered":"https:\/\/www.pi.infn.it\/?page_id=8295"},"modified":"2021-09-06T08:23:53","modified_gmt":"2021-09-06T06:23:53","slug":"at-db-ds03","status":"publish","type":"page","link":"https:\/\/www.pi.infn.it\/?page_id=8295","title":{"rendered":"AT – db – ds03"},"content":{"rendered":"\n\n\n\n\n
Attrezzatura<\/em><\/span><\/td>\nNome<\/em><\/span><\/td>\nInventario n.<\/em><\/span><\/td>\nNote\/Info<\/em><\/span><\/td>\n<\/tr>\n
Model 5100B Scanner
<\/em><\/td>\n		System 5000
<\/em><\/td>\n		x<\/strong><\/em><\/td>\nVishay<\/em><\/a><\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

TestoVishay Micro Measurements Model 5100B Scanner for static acquisition and digitalization of 20 channels of various analog inputs. – DataSheet<\/em><\/a><\/p>\n\n\n\n\n
\"\"<\/td>\n<\/tr>\n
\n
FEATURES
<\/span><\/h6>\n

\u2022 From 5 to 1200 input channels\u2014can be configured as
needed at any time
\u2022 Inputs accepted from strain gages and strain-gagebased transducers (Model 5110A), thermocouples
(Model 5120A), sensors with high-level voltage output
(Model 5130B), and LVDTs (Model 5140A)
\u2022 Built-in bridge completion for 120-, 350-, and 1000-ohm
strain gages
\u2022 Scanning and recording intervals as short as
0.02 seconds for up to 1200 inputs
\u2022 Stable, accurate, low-noise signal conditioning
\u2022 Available with PCI and PCIe hardware Interface<\/span> <\/p>\n

DESCRIPTION<\/span><\/h6>\n

System 5000\u2019s Model 5100B Scanners acquire test data
within 1 millisecond from up to 1200 channels at scan
intervals as short as 0.02 seconds. This translates into
more accurate test results, and the ability to capture data
under static loading conditions immediately before failure.
Sensor connections are quickly made to the cards at the
rear of each scanner in System 5000. Strain gage cards
include built-in bridge completion for quarter and half
bridges, and a constant voltage power supply for 0, 0.5,
1, 2, 5, and 10 VDC bridge excitation.
System 5000\u2019s instrumentation hardware is designed to
incorporate all the features required for precision strain
measurement under static loading conditions, while
maintaining flexibility and ease of use. A system can
be configured with as few as 5, and as many as 1200,
sensors. Since each Model 5100B Scanner can function
independently, your System 5000 components can easily
be configured with StrainSmart software for each test
requirement.<\/span> <\/p>\n

    \n
  • INPUTS<\/span><\/li>\n
  • Accepts up to four cards (five channels per card and
    up to 20 channels per scanner).<\/span><\/li>\n
  • A\/D CONVERTER<\/span>16-bit (15-bit plus sign) successive approximation
    converter. Usable resolution is typically 15 bits. 40 \u03bcs
    total conversion time per reading.<\/span><\/li>\n
  • SCAN RATE
    <\/span>1 ms per scan. Fifty complete scans per second typical usage. Concurrent scanning for all scanners.
    Input channels in each single scanner are scanned
    sequentially at 0.04-ms intervals and stored in random access memory within a 1-ms window.<\/span><\/li>\n
  • DIGITAL OUTPUT
    <\/span>NO and NC relay contacts (500 mA at 30 VDC into a
    resistive load)<\/span><\/li>\n
  • OPERATIONAL ENVIRONMENT
    Temperature
    <\/span>\u201310\u00b0 to +50\u00b0C
    <\/span>Humidity
    <\/span>Up to 90% RH, non-condensing<\/span><\/li>\n
  • SIZE
    <\/span>3.5 H x 19 W x 16 D in (89 x 483 x 381 mm)<\/span><\/li>\n
  • WEIGHT
    <\/span>16 lb (7.25 kg)<\/span><\/li>\n
  • POWER
    <\/span>115 or 230 VAC user-selectable
    \u00b110% of setting; 50\/60 Hz; 140W max<\/span> <\/li>\n<\/ul>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

    Attrezzatura Nome Inventario n. Note\/Info Model 5100B Scanner System 5000 x Vishay TestoVishay Micro Measurements Model 5100B Scanner for static acquisition and digitalization of 20 channels of various analog inputs. – DataSheet FEATURES \u2022 From 5 to 1200 input channels\u2014can be configured asneeded at any time\u2022 Inputs accepted from strain gages and strain-gagebased transducers (Model […]<\/p>\n","protected":false},"author":30,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_links_to":"","_links_to_target":""},"publishpress_future_action":{"enabled":false,"date":"2026-05-15 14:57:25","action":"change-status","newStatus":"draft","terms":[],"taxonomy":"language"},"_links":{"self":[{"href":"https:\/\/www.pi.infn.it\/index.php?rest_route=\/wp\/v2\/pages\/8295"}],"collection":[{"href":"https:\/\/www.pi.infn.it\/index.php?rest_route=\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.pi.infn.it\/index.php?rest_route=\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.pi.infn.it\/index.php?rest_route=\/wp\/v2\/users\/30"}],"replies":[{"embeddable":true,"href":"https:\/\/www.pi.infn.it\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=8295"}],"version-history":[{"count":7,"href":"https:\/\/www.pi.infn.it\/index.php?rest_route=\/wp\/v2\/pages\/8295\/revisions"}],"predecessor-version":[{"id":8312,"href":"https:\/\/www.pi.infn.it\/index.php?rest_route=\/wp\/v2\/pages\/8295\/revisions\/8312"}],"wp:attachment":[{"href":"https:\/\/www.pi.infn.it\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=8295"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}