{"id":7850,"date":"2021-07-30T08:21:36","date_gmt":"2021-07-30T06:21:36","guid":{"rendered":"https:\/\/www.pi.infn.it\/?page_id=7850"},"modified":"2021-07-30T09:24:34","modified_gmt":"2021-07-30T07:24:34","slug":"at-db-0021","status":"publish","type":"page","link":"https:\/\/www.pi.infn.it\/?page_id=7850","title":{"rendered":"AT – db – 0021"},"content":{"rendered":"\n\n\n\n\n
Attrezzatura<\/em><\/span><\/td>\nNome<\/em><\/span><\/td>\nInventario n.<\/em><\/span><\/td>\nNote\/Info<\/em><\/span><\/td>\n<\/tr>\n
HP 4263 LCR Meter<\/em><\/td>\nHP 4263<\/em><\/td>\n\u00a0<\/td>\nManuale<\/em><\/a><\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n
4263B LCR Meter, 100 Hz to 100 kHz<\/h5>\n

Link: https:\/keysight.com<\/a><\/p>\n\n\n\n\n
\n
HP \/ Agilent 4263B
LCR Meter, Refurbished<\/span><\/h6>\n<\/td>\n<\/tr>\n
\n
    \n
  • 0.1% basic accuracy<\/b><\/li>\n
  • 100 Hz, 120 Hz, 1 kHz, 10 kHz, 100 kHz test frequencies<\/b><\/li>\n
  • 20 m to 1 Vrms in 5m Vrms steps<\/b><\/li>\n
  • Test signal level monitor function<\/b><\/li>\n
  • High-speed measurement: 25 ms<\/b><\/li>\n
  • High-speed contact check<\/b><\/li>\n
  • Wide capacitance test range<\/b><\/li>\n
  • Transformer parameter measurements (optional)<\/b><\/li>\n<\/ul>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n\n\n\n\n
    \"\"<\/td>\n<\/tr>\n
    \n

    HP 4263B LCR meter is Hewlett-Packard’s most cost-effective low-end LCR meter, designed for both component evaluation on the production line and fundamental impedance testing for bench-top applications.\u00a0 The 4263B has five test frequencies that allow you to simulate testing under the correct conditions: 100 Hz, 120 Hz, 1 kHz, 10 kHz, and 100 kHz.\u00a0 An optional 20 kHz test frequency can be added to those five frequencies Option 002).<\/p>\n

    High-Speed Measurements<\/b><\/p>\n

    The 4263B can boost throughput with a measurement speed of 25 ms at any test frequency.\u00a0 This ability improves the throughput of electrolytic capacitor and transformer testing.\u00a0 The 4263B can check the contact condition between the test terminals and the device-under-test (DUT).\u00a0 This function ensures the reliability of PASS\/FAIL testing with automatic handlers in production.\u00a0 The quick recovery system of the 4263B improves throughput.\u00a0 Normal operation is resumed the instant a faulty DUT is removed from the handler, so the handler can always be operated at its full speed.<\/p>\n

    Electrolytic Capacitor Measurements<\/b><\/p>\n

    The 4263B’s accuracy and wide measurement range are the right tools to make precise measurements of electrolytic capacitors.\u00a0 Charged capacitors can discharge through the front end and destroy an instrument.\u00a0 The 4263B’s front end is designed for protection and maintains test integrity.<\/p>\n

    Transformer Parameter Measurements<\/b><\/p>\n

    With the 4263B’s ability to make turns ratio (N), mutual inductance (M), and dc resistance (DCR) measurements, data calculations and changing test setups are no longer time-consuming tasks (Option 001).\u00a0 The flexible signal level setting and the voltage-and-current monitor function facilitate the use of the H4263B for level dependent DUTs, such as core inductors.<\/p>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

    Attrezzatura Nome Inventario n. Note\/Info HP 4263 LCR Meter HP 4263 \u00a0 Manuale 4263B LCR Meter, 100 Hz to 100 kHz Link: https:\/keysight.com HP \/ Agilent 4263BLCR Meter, Refurbished 0.1% basic accuracy 100 Hz, 120 Hz, 1 kHz, 10 kHz, 100 kHz test frequencies 20 m to 1 Vrms in 5m Vrms steps Test signal […]<\/p>\n","protected":false},"author":30,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_links_to":"","_links_to_target":""},"publishpress_future_action":{"enabled":false,"date":"2026-05-15 09:36:58","action":"change-status","newStatus":"draft","terms":[],"taxonomy":"language"},"_links":{"self":[{"href":"https:\/\/www.pi.infn.it\/index.php?rest_route=\/wp\/v2\/pages\/7850"}],"collection":[{"href":"https:\/\/www.pi.infn.it\/index.php?rest_route=\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.pi.infn.it\/index.php?rest_route=\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.pi.infn.it\/index.php?rest_route=\/wp\/v2\/users\/30"}],"replies":[{"embeddable":true,"href":"https:\/\/www.pi.infn.it\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=7850"}],"version-history":[{"count":10,"href":"https:\/\/www.pi.infn.it\/index.php?rest_route=\/wp\/v2\/pages\/7850\/revisions"}],"predecessor-version":[{"id":7867,"href":"https:\/\/www.pi.infn.it\/index.php?rest_route=\/wp\/v2\/pages\/7850\/revisions\/7867"}],"wp:attachment":[{"href":"https:\/\/www.pi.infn.it\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=7850"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}